Publications
  1.  S.P. Formica, S.M. Lee, X-ray fluorescence system for thin film composition analysis during deposition,  Thin Solid Films, 491: 71-77 (2005).
  2.  J. Schmidt, S.P. Formica and S.M. Lee, Polycapillary optic-enhanced x-ray diffraction and fluorescence for rapid materials analysis Proc. SPIE Vol. 5918 (2005).
  3.  S.M. Lee and S.P. Formica, Comparing X-ray Optics: Performance Standards. J. X-ray Sci. Tech. 13: 37-47 (2005).
  4.  S.P. Formica and S.M. Lee, An in situ XRF system for composition mapping of thin film IR sensors. Proc. SPIE  (2005).
  5.  S.P. Formica and S.M. Lee. Physical Analysis of High Intensity Focusing X-ray Optics: Doubly Curved Crystals vs. Highly Focusing Polycapillaries. Proc. SPIE, Advances in Laboratory-Based X-ray Sources and Optics III. 4781: 77-86 (2002).
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