Recommended Books on Electron Microprobe Analysis
Below are my recommendations for books about electron microprobe analysis:
Title: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
Author: S.J.B. Reed
Publisher: Cambridge University Press; 2nd edition, 2006
Description from the Publisher: Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
Book Reviews:
"The subject is treated in a clear and logical fashion... Dr. Reed has produced an excellent and thoroughly readable book... highly recommended for all those who use the electron microprobe." Allan Pring, Geological Magazine.
"A good introductory level of information on all the main aspects of scanning electron microscopy and microanalysis that is not so readily available anywhere else. The book is well illustrated and written in a clear and readable style... It is strongly recommended for new users and should have a place in every laboratory. It would make an excellent textbook for introductory courses." M.T. Styles, Mineralogy and Petrology Group, British Geological Survey.
"This book is a valuable introduction to the use and geological application of scanning electron microscopes and electron microprobes... by far the most readable of the microscope/microprobe books that I have seen... It is pitched at the right level for the market at which it is aimed, postgraduate and postdoctoral workers, or geologists in industrial laboratories... It is a splendid book that should sit on the bookshelf of anybody working with electron microscopes and microprobes, be part of any laboratory and be required reading for any graduate student working with microbeam techniques." Peter Treloar, School of Geological Sciences, Kingston University.
Title: Electron Microprobe Analysis
Author: S.J.B. Reed
Publisher: Cambridge University Press; 2nd edition, 1993
Description from the Publisher: This book gives a comprehensive account of both experimental and theoretical aspects of electron microprobe analysis, and is an extensively updated version of the seminal first edition, published in 1975. The design and operation of the instrument, including the electron column and both wavelength- and energy-dispersive X-ray spectrometers, are covered in the first part of the book. Experimental procedures for qualitative and quantitative analysis, using both types of spectrometer, are then discussed. Matrix (ZAF) corrections, as required for quantitative analysis, are treated in some detail from both theoretical and practical viewpoints. Special considerations applying to the analysis of 'light' elements (atomic number below 10) are covered in a separate chapter. The emphasis throughout is on a sound understanding of principles and the treatment is applicable equally to the electron microprobe in its 'classical' form and to scanning electron microscopes fitted with X-ray spectrometers.
Book Reviews:
"...well laid out, easy to read... with ample line diagrams. It provides an excellent introduction to microanalysis, and a reminder of the extent to which the technique has been developed. It should find a home in any laboratory doing serious microanalysis." Microscopy and Analysis.
"... I can strongly recommend this book because of its eminently readable style and because it succeeds on several different levels: it provides general background information, it combines a theoretical base with practical applications, and it is a source of reference from which the analyst can readily sample." Mineralogical Magazine.
Title: Scanning Electron Microscopy and X-ray Microanalysis
Authors: J. Goldstein, D.E. Newbury, D.C. Joy, C.E. Lyman, P. Echlin, E. Lifshin, L.C. Sawyer, J.R. Michael
Publisher: Plenum US; 3rd edition, 2003
Description from the Publisher: This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis and the methodology for structural analysis using electron back-scatter diffraction. SEM sample preparation methods for hard materials, polymers, and biological specimens are covered in separate chapters. In addition techniques for the elimination of charging in non-conducting specimens are detailed. A data base of useful parameters for SEM and X-ray micro-analysis calculations and enhancements to the text chapters are available on an accompanying CD. This is the third edition of this highly acclaimed text and has been extensively revised. The text has been used in educating over 3,000 students at the Lehigh SEM short course as well as thousands of undergraduate and graduate students at universities in every corner of the globe. The authors have made extensive changes to the text and figures in this edition as a result of their experience in teaching the various concepts of SEM and x-ray microanalysis.
Book Reviews:
"There is no other single volume that covers as much theory and practice of SEM or X-ray microanalysis as Scanning Electron Microscopy and X-ray Microanalysis, 3rd Edition does... This is a reference text that no SEM or EPMA laboratory should be without." Thomas J. Wilson in Scanning 27(4), July/August 2005.
"As the authors pointed out, the number of equations in the book is kept to a minimum, and important conceptions are also explained in a qualitative manner. An enhancement CD gives useful database and more detailed discussions on some equations. A lot of very distinct images and schematic drawings make for a very interesting book and help readers who study scanning electron microscopy and X-ray microanalysis. The principal application and sample preparation given in this book are suitable for undergraduate students and technicians learning SEEM and EDS/WDS analyses. It is an excellent textbook for graduate students, and an outstanding reference for engineers, physical, and biological scientists." Microscopy and Microanalysis 9:5, October 2003.
5/23/07
Added:
Electron Microprobe Analysis in Archaeology
Electron microprobe analysis (EMPA), also known as electron probe microanalysis (EPMA), is an analytical technique that combines scanning electron microscopy (SEM) and compositional analysis using x-ray spectrometry. The ability to determine structure and chemistry of samples makes EMPA very versatile. This is a dominant analytical technique in geology, but it is not as commonly used in archaeology despite similar materials in studied both fields. Here I will post about topics in EMPA, artifacts I have analyzed, archaeological studies that use EMPA, etc. If there is a topic you'd like to see posted here, please let me know.
Ellery Frahm
Doctoral Candidate, Archaeology
Research Fellow, Geology & Geophysics
University of Minnesota - Twin Cities
